[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Impact of layout at advanced technology nodes on the performance and variation of digital and analog figures of merit
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内容摘要
[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Impact of layout at advanced technology nodes on the performance and variation of digital and analog figures of merit
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