[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - A study of capacitance-voltage hysteresis in HfO2 /InGaAs metal-oxide-semiconductor systems
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![[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - A study of capacitance-voltage hysteresis in HfO<inf>2</inf>/InGaAs metal-oxide-semiconductor systems](/images/quick-response-icon.jpg){kind=icon}
内容摘要
[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - A study of capacitance-voltage hysteresis in HfO
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